Showing results: 151 - 165 of 268 items found.
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GX5280 Series -
Marvin Test Solutions, Inc.
The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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PRS-812B -
Prostat Corporation
- Wide Range Resistance: 0.10 Ω to 1.00x1012 Ω- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Constant Test voltages 10V and 100V for specification measurements to meet international and domestic ESD measurement standards- Auto Resistance Range Control- Auto Test Voltage Control- Uses a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- 120 Data Set Internal Memory- Uses Standard USB Cable for Charging- Charges in 2 Hours- 2-year Limited Warranty on Main Instrument
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T3DSO3000 Series -
Teledyne LeCroy
Teledyne Test Tools new T3DSO3000 Oscilloscopes feature four channel models with analog bandwidth options from 200 MHz to 1 GHz. Each model offers a maximum sample rate of 5 GSa/s, and a maximum memory depth of 250 Mpts in half channel mode. All models incorporate two 5 GSa/s ADCs and two 250 Mpts memory modules. When all channels are enabled, each channel has sample rate of 2.5 GSa/s and a standard record length of 125 Mpts. When only a single channel per ADC is active, the maximum sample rate is 5 GSa/s and the maximum record length is 250 Mpts. For ease-of-use, the most used functions can be accessed with its user-friendly front panel design.
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T3DSO2000 Series -
Teledyne LeCroy
Teledyne Test Tools new T3DSO2000 Oscilloscopes feature two channel and four channel models with analog bandwidth options from 100 MHz to 300 MHz. Each model offers a maximum sample rate of 2 GSa/s, and a maximum memory depth of 140 Mpts in half channel mode. The four channel models incorporates two 2 GSa/s ADCs and two 140 Mpts memory modules. When all channels are enabled, each channel has sample rate of 1 GSa/s and a standard record length of 70 Mpts. When only a single channel per ADC is active, the maximum sample rate is 2 GSa/s and the maximum record length is 140 Mpts. For ease-of-use, the most commonly used functions can be accessed with its user-friendly front panel design.
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JT 37×7/PXIE -
JTAG Technologies Inc.
High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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MR-30 -
PINTEK Electronics
*Double LCD Display*300,000 counts resolution*Measurement Range: 30mΩ~3MΩ*0.05% accuracy*20 Standard User setting memory sets*Sorting function and Relative percentage function*PASS/FAIL test result alarm*Computer Remote Manual and Auto Scan function*Manual and Auto Channel select*Sampling Rate: 30 sample/sec*High Resolution Temperature compensation and measurement*DUT Four-wire method*USB interface
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FS2520 -
FuturePlus Systems
The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.
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NX5000 Series -
Marvin Test Solutions, Inc.
ROM emulation is a powerful and versatile method of microprocessor testing. ROM emulation has emerged as the technique of choice for microprocessor test and diagnostic applications. A microprocessor-based board is tested by replacing the boot ROMs on the Unit Under Test (UUT) with memory emulation pods. Each pod handles eight bits of the data bus. Processors from 8 to 32 bits can be controlled with one to four pods (even the most advanced CPUs such as the Intel Pentium generally use only an eight-bit boot path). The emulator takes control of the UUT by resetting the processor and, under the test program’s control (monitor program), exercises all functions on the board. Synchronization with the UUT is automatic and requires no additional hardware or connections.
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DU-6210 -
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 10 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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DU-6211 -
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 75 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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DU-6212/6215/6216 -
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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DU-6218 -
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.
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Meco Instruments Pvt. Ltd.,
Basic Accuracy 0.25%Max. Test Current : 5A (120mV) for 7002Max. Test Current : 10A (60mV) for 7272Manual or Auto RangeFour Terminal Kelvin Measurement6 Ranges with 1mV Best ResolutionMeasurement of Resistive and Inductive MaterialsSetting for HI, LO & PASS ReadingsMemory of 3000 Measurements DataProgrammable HI-LO Alarm with memory of 20 DataLarge LCD with Backlight & HOLD FunctionLow Power ConsumptionBattery Operated with AC AdaptorLow Battery (Voltage) AlarmLED indication for Invalid Resistance MeasurementCable Length Measurement in feet & metersUser Interface Software for PC Communication via RS232C(to USB Bridge) cableBuilt-inBatery Chaging Circuit & Calender Clock
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IT8200 Series -
I-TECH Electronic Co., Ltd
IT8200 series economical programmable electronic load,with the highest cost/performance ratio and small size, they are widely used in production testing lines and maintainance lines etc. Resolution 1mV/1mA ensures the accurate measurement result. IT8200 series has programmable performance, and can quickly recall 4 * 40 group memory data, panel function keys and display interface is clear, provide customers with simple operation program, easy and fast to complete a variety of complex tests. The series has CV, CC and CR mode, and short circuit test function, it is the most cost-effective electronic load products.
